Dr. Takashi Fuse
Engineer at Tokyo Electron AT Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 March 2008 Paper
Tadashi Kotsugi, Takashi Fuse, Hidetoshi Kinoshita, N. William Parker
Proceedings Volume 6921, 69211V (2008) https://doi.org/10.1117/12.771753
KEYWORDS: Beam shaping, Semiconducting wafers, Electron beam direct write lithography, Objectives, Monochromatic aberrations, Solids, Electron beams, Ray tracing, Image processing, Silicon

Proceedings Article | 20 March 2008 Paper
K. Takeya, T. Fuse, H. Kinoshita, N. William Parker
Proceedings Volume 6921, 69212J (2008) https://doi.org/10.1117/12.771754
KEYWORDS: Electrodes, Tolerancing, Beam shaping, Semiconducting wafers, Lenses, Manufacturing, Gaussian beams, Error analysis, Optical components, Imaging systems

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