Takashi Shiraishi
at Toshiba Tec Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 July 1999
Proc. SPIE. 3787, Optical Scanning: Design and Application
KEYWORDS: Beam splitters, Image processing, Error analysis, Laser development, Semiconductor lasers, Laser scanners, Printing, Plastic lenses, Optical scanning systems, Tolerancing

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