Takashi Wakui
at FUJIFILM Corp
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 2 November 2017
JMI Vol. 4 Issue 04
KEYWORDS: Optical inspection, Image analysis, Image quality, Stem cells, Sensors, Image processing, Inspection, Phase contrast, Machine learning, Image classification

Proceedings Article | 29 October 2005
Proc. SPIE. 5983, Remote Sensing for Environmental Monitoring, GIS Applications, and Geology V
KEYWORDS: Thermography, Reflection, Cameras, Glasses, Image processing, Reflectivity, 3D metrology, Spherical lenses, Thermal imaging cameras, 3D image processing

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