Dr. Takayuki Tanaka
at Hokkaido Univ
SPIE Involvement:
Symposium Committee | Conference Co-Chair | Author | Editor
Publications (20)

PROCEEDINGS ARTICLE | November 17, 2008
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: Opto mechatronics, Current controlled current source

PROCEEDINGS ARTICLE | November 17, 2008
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: Statistical analysis, Opto mechatronics, Imaging systems, Cameras, Error analysis, Stereoscopic cameras, Object recognition, Camera shutters, Current controlled current source

PROCEEDINGS ARTICLE | November 17, 2008
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: Statistical analysis, Agriculture, Fluctuations and noise, Robots, Stereoscopic cameras, Distance measurement, 3D metrology, Mobile robots, Information science, 3D image processing

PROCEEDINGS ARTICLE | May 29, 2007
Proc. SPIE. 6356, Eighth International Conference on Quality Control by Artificial Vision
KEYWORDS: Lithium, Image compression, Imaging systems, Cameras, Calibration, Control systems, Iris, Image quality, Information technology, Sensing systems

PROCEEDINGS ARTICLE | October 19, 2006
Proc. SPIE. 6375, Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems
KEYWORDS: Agriculture, Image compression, Detection and tracking algorithms, Cameras, Sensors, Image processing, Computing systems, Information technology, Velocity measurements, Prototyping

PROCEEDINGS ARTICLE | October 19, 2006
Proc. SPIE. 6375, Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems
KEYWORDS: Image processing algorithms and systems, Statistical analysis, Image segmentation, Image processing, Computing systems, Image quality, Light sources and illumination, Algorithm development, Ruthenium, Evolutionary algorithms

Showing 5 of 20 publications
Conference Committee Involvement (3)
International Symposium on Optomechatronic Technologies
17 November 2008 | San Diego, United States
Optomechatronic Sensors and Instrumentation II
3 October 2006 | Boston, Massachusetts, United States
Optomechatronic Sensors and Instrumentation
5 December 2005 | Sapporo, Japan
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