Prof. Tamotsu Hashizume
at Hokkaido Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | February 26, 2016
Proc. SPIE. 9748, Gallium Nitride Materials and Devices XI
KEYWORDS: Oxides, Etching, Electrodes, Interfaces, Atomic force microscopy, Scanning electron microscopy, Transmission electron microscopy, Gallium nitride, Transistors, Field effect transistors, Heterojunctions, Electrochemical etching, Oxidation

PROCEEDINGS ARTICLE | February 19, 2009
Proc. SPIE. 7216, Gallium Nitride Materials and Devices IV
KEYWORDS: Oxides, Photonic devices, Electrodes, Control systems, Electronic components, Gallium nitride, Capacitance, Field effect transistors, Radiation effects, Oxidation

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