Dr. Tanfer Yandayan
Chief Research Scientist at TUBITAK UME
SPIE Involvement:
Conference Program Committee | Author
Publications (4)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Optical components, X-ray optics, Metrology, Calibration, X-rays, Inspection, Autocollimators, Synchrotrons, Synchrotron radiation, Precision calibration

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Telescopes, Mirrors, X-ray optics, Metrology, Calibration, X-rays, Space telescopes, Autocollimators, Measurement devices, Synchrotrons

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Mirrors, Metrology, Calibration, Inspection, Computer programming, Optical testing, Head, Autocollimators, Synchrotrons, Optics manufacturing

PROCEEDINGS ARTICLE | November 20, 2003
Proc. SPIE. 5190, Recent Developments in Traceable Dimensional Measurements II
KEYWORDS: Interferometers, Cameras, Calibration, Error analysis, Manufacturing, Computer programming, Aluminum, Laser optics, Standards development, Temperature metrology

Conference Committee Involvement (3)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
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