Dr. Tanfer Yandayan
Chief Research Scientist at TUBITAK UME
SPIE Involvement:
Conference Program Committee | Author
Publications (4)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Calibration, Autocollimators, Metrology, X-rays, Precision calibration, Synchrotrons, Inspection, X-ray optics, Optical components, Synchrotron radiation

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Autocollimators, Metrology, Calibration, Measurement devices, X-ray optics, X-rays, Synchrotrons, Space telescopes, Telescopes, Mirrors

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Autocollimators, Calibration, Metrology, Computer programming, Mirrors, Inspection, Synchrotrons, Head, Optical testing, Optics manufacturing

PROCEEDINGS ARTICLE | November 20, 2003
Proc. SPIE. 5190, Recent Developments in Traceable Dimensional Measurements II
KEYWORDS: Computer programming, Interferometers, Calibration, Temperature metrology, Laser optics, Cameras, Error analysis, Standards development, Manufacturing, Aluminum

Conference Committee Involvement (3)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
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