Prof. Tanroku Miyoshi
at Kobe Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Semiconductors, Scattering, Particles, Electrons, 3D modeling, Quantum dots, Monte Carlo methods, Device simulation, Instrument modeling, Correlation function

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