Dr. Tao Chen
at National Univ of Defense Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 4, 2005
Proc. SPIE. 6044, MIPPR 2005: Image Analysis Techniques
KEYWORDS: Edge detection, Lithium, Visual process modeling, Detection and tracking algorithms, Sensors, Image processing, Remote sensing, Image registration, Defense technologies, Algorithm development

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