Dr. Tao Xian
Engineering Fellow at
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | October 12, 2006
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: Signal to noise ratio, Scanning tunneling microscopy, Cameras, Sensors, Point spread functions, Convolution, Image filtering, Imaging systems, Switching, Image enhancement

PROCEEDINGS ARTICLE | November 7, 2005
Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III
KEYWORDS: Binary data, Cameras, Signal to noise ratio, Sensors, Head, Image processing, Scanning tunneling microscopy, Polonium, Image sensors, Imaging systems

PROCEEDINGS ARTICLE | November 7, 2005
Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III
KEYWORDS: Sensors, Calibration, Cameras, Vignetting, Polonium, Sensor calibration, Digital cameras, Binary data, Image sensors, Geometrical optics

PROCEEDINGS ARTICLE | December 16, 2004
Proc. SPIE. 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
KEYWORDS: Zoom lenses, Calibration, 3D modeling, Cameras, Content addressable memory, Systems modeling, Imaging systems, 3D image processing, Stereoscopic cameras, Error analysis

PROCEEDINGS ARTICLE | October 10, 2000
Proc. SPIE. 4222, Process Control and Inspection for Industry
KEYWORDS: Diffusion, Three dimensional sensing, Modulation, Binary data, Optical filters, Computer simulations, Phase shift keying, Transparency, Computer programming, Linear filtering

PROCEEDINGS ARTICLE | December 31, 1996
Proc. SPIE. 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96)
KEYWORDS: Computer simulations, Speckle, Speckle pattern, Surface roughness, Point spread functions, Imaging systems, Distance measurement, Lithium, Optoelectronics, Laser applications

Showing 5 of 6 publications
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