Dr. Taoran Wei
at Huazhong Univ of Science and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Image processing algorithms and systems, Data modeling, Image segmentation, Silicon, Inspection, Computer simulations, Image quality, Statistical modeling

Proceedings Article | 12 January 2018 Paper
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Digital signal processing, Defect detection, Convolutional neural networks, Data modeling, Feature extraction, Machine vision

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