Mr. Taras Hanulia
at Shizuoka University
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 27, 2014
Proc. SPIE. 9172, Nanostructured Thin Films VII
KEYWORDS: Oxides, Thin films, Ellipsometry, Refractive index, Transparency, Optical properties, Reflection, Indium, Silicon, Tin

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top