Taras Hanulia
at Shizuoka University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 August 2014 Paper
Proceedings Volume 9172, 917211 (2014) https://doi.org/10.1117/12.2061185
KEYWORDS: Refractive index, Oxides, Optical properties, Ellipsometry, Indium, Tin, Transparency, Silicon, Thin films, Reflection

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