The method of Differential Reflection Spectroscopy (DRS) have been applied to study thin iron films during the process of growth on Si (111) or Si(100) surfaces at room temperature. Some details on the Dynamic Standard method in DRS method are presented. Magnetic properties of as-grown films have been demonstrated by the SMOKE method. Dependence ofdielectric functions of the films on the deposit amount is given.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.