Ted Kamprath
Optical Fabrication Manager at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 21, 2007
Proc. SPIE. 6671, Optical Manufacturing and Testing VII
KEYWORDS: Ellipsometry, Polishing, Laser induced damage, High power lasers, Surface roughness, Nondestructive evaluation, Atomic force microscopy, Spectroscopic ellipsometry, Optical interferometry, Surface finishing

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