Teena James
PhD student at Johns Hopkins Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 24, 2010
Proc. SPIE. 7767, Instrumentation, Metrology, and Standards for Nanomanufacturing IV
KEYWORDS: Thin films, Nanostructures, Electron beam lithography, Etching, Nickel, Silicon, Silver, Chromium, Plasma etching, Tin

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