Teng-da Zhang
at Hefei University of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 January 2016
Proc. SPIE. 9903, Seventh International Symposium on Precision Mechanical Measurements
KEYWORDS: Defect detection, Cameras, Inspection, Fourier transforms, Image resolution, LCDs, Flat panel displays, Binary data, Fiber optic illuminators, Defect inspection

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