Prof. Teodor P. Gotszalk
at Wroclaw Univ of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (17)

PROCEEDINGS ARTICLE | November 10, 2016
Proc. SPIE. 10161, 14th International Conference on Optical and Electronic Sensors
KEYWORDS: Signal to noise ratio, Laser sources, Electronics, Sensors, Calibration, Data acquisition, Head, Microopto electromechanical systems, Micromirrors, System integration

PROCEEDINGS ARTICLE | September 16, 2014
Proc. SPIE. 9236, Scanning Microscopies 2014
KEYWORDS: Electronics, Optical lithography, Sensors, Microscopy, Silicon, Amplifiers, Platinum, Bridges, Semiconducting wafers, Wheatstone bridges

PROCEEDINGS ARTICLE | September 16, 2014
Proc. SPIE. 9236, Scanning Microscopies 2014
KEYWORDS: Actuators, Optical fibers, Metrology, Sensors, Calibration, Microscopy, Silicon, Atomic force microscopy, Standards development, Wheatstone bridges

PROCEEDINGS ARTICLE | April 14, 2014
Proc. SPIE. 9050, Metrology, Inspection, and Process Control for Microlithography XXVIII
KEYWORDS: Actuators, Lithography, Metrology, Sensors, Metals, Silicon, Resistance, Scanning probe microscopy, Piezoresistive sensors, Wheatstone bridges

PROCEEDINGS ARTICLE | July 25, 2013
Proc. SPIE. 8902, Electron Technology Conference 2013
KEYWORDS: Gold, Silica, Molecules, Silicon, Manufacturing, Atomic force microscopy, Printing, Self-assembled monolayers, Molecular electronics, Molecular self-assembly

PROCEEDINGS ARTICLE | July 25, 2013
Proc. SPIE. 8902, Electron Technology Conference 2013
KEYWORDS: Nanostructures, Biosensing, Silicon, Reliability, Atomic force microscopy, Scanning electron microscopy, Sensing systems, Field effect transistors, Nanolithography, Nanowires

Showing 5 of 17 publications
Conference Committee Involvement (1)
Smart Sensors, Actuators, and MEMS VII
4 May 2015 | Barcelona, Spain
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