Dr. Terry R. Todd
Corporate Fellow at Guided Wave Inc
SPIE Involvement:
Conference Chair | Editor | Author
Area of Expertise:
NIR & IR Spectroscopy , Chemometrics , Spectroscopic Instrument Design , Process Analytics , Radiation Theromometry
Publications (4)

PROCEEDINGS ARTICLE | February 26, 1999
Proc. SPIE. 3537, Electro-Optic, Integrated Optic, and Electronic Technologies for Online Chemical Process Monitoring

PROCEEDINGS ARTICLE | February 26, 1999
Proc. SPIE. 3537, Electro-Optic, Integrated Optic, and Electronic Technologies for Online Chemical Process Monitoring

SPIE Conference Volume | August 14, 1992

Conference Committee Involvement (2)
On-Line Chemical Process Monitoring with Advanced Techniques
2 November 1998 | Boston, MA, United States
Optically Based Methods for Process Analysis
23 March 1992 | Somerset, NJ, United States
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