Thato Kgakatsi
at National Metrology Institute of South Africa
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 January 2019 Paper
Proceedings Volume 11043, 110430X (2019) https://doi.org/10.1117/12.2501142
KEYWORDS: Diodes, Precision measurement, Semiconductors, Control systems, Switching, Calibration, Capacitance, Metrology, Power supplies, Differential equations

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