Dr. Theodore C. Oakberg
Senior Applications Scientist at Hinds Instruments Inc
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 13 September 2007
Proc. SPIE. 6682, Polarization Science and Remote Sensing III
KEYWORDS: Optical components, Refractive index, Antireflective coatings, Modulation, Silicon, Coating, Reflectivity, Polarimetry, Far infrared, Absorption

Proceedings Article | 25 September 2002
Proc. SPIE. 4819, Polarization Measurement, Analysis, and Applications V
KEYWORDS: Polarization, Sensors, Photomultipliers, Silicon, Amplifiers, Photodiodes, Polarizers, Photoelastic modulators, Dichroic materials, Signal detection

Proceedings Article | 15 November 2000
Proc. SPIE. 4133, Polarization Analysis, Measurement, and Remote Sensing III
KEYWORDS: Light sources, Electronics, Lithium, Calibration, Ultraviolet radiation, Calcium, Polarizers, Synchrotrons, Photoelastic modulators, Dichroic materials

Proceedings Article | 25 October 1999
Proc. SPIE. 3754, Polarization: Measurement, Analysis, and Remote Sensing II
KEYWORDS: Optical components, Optical amplifiers, Statistical analysis, Modulation, Polarization, Birefringence, Sensors, Photomasks, Compact discs, Signal detection

Proceedings Article | 25 October 1999
Proc. SPIE. 3754, Polarization: Measurement, Analysis, and Remote Sensing II
KEYWORDS: Optical components, Light sources, Silica, Birefringence, Sensors, Calibration, Ultraviolet radiation, Calcium, Polarizers, Photoelastic modulators

Showing 5 of 10 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top