Dr. Thi-Thu-Hien Pham
Professor at International Univ
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | September 6, 2012
JBO Vol. 17 Issue 9
KEYWORDS: Dichroic materials, Statistical analysis, Statistical modeling, Sensors, Error analysis, Calibration, Composites, Polarimetry, Polarization, Phase measurement

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