Dr. Thiago Figueiro
VP Business Development at ASELTA Nanographics
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Profile Summary

Computer engineer with a MSc and PhD in microelectronics, with more than 10 years of combining experiences in the development of EDA and image/signal processing software. Experience in modeling and statistics. Knowledge on IC design flow, especially on the back-end (standard-cell libraries creation and characterization). Knowledge on Lithography, specially Mask-Dataprep and e-beam mask writing and direct writing. Specialities: EDA algorithms. Modeling, Image Processing, object modeling and recognition, artificial intelligence. Programming in C++, Perl, Python, C, Java and Matlab.
Publications (20)

Proceedings Article | 10 March 2021 Presentation + Paper
Proc. SPIE. 11611, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV
KEYWORDS: Metrology, Visualization, Etching, Image processing, Electron microscopes, Distortion, Scanning electron microscopy, Critical dimension metrology, Semiconducting wafers, Overlay metrology

Proceedings Article | 9 March 2021 Presentation + Paper
Proc. SPIE. 11611, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV

Proceedings Article | 23 February 2021 Presentation
Proc. SPIE. 11611, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV

Proceedings Article | 22 February 2021 Presentation + Paper
Proc. SPIE. 11611, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV

Proceedings Article | 22 February 2021 Presentation + Paper
Proc. SPIE. 11611, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV

Showing 5 of 20 publications
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