Dr. Thierry d'Almeida
at ESRF
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 October 2002 Paper
Proc. SPIE. 4780, Surface Scattering and Diffraction for Advanced Metrology II
KEYWORDS: Diffraction, Metrology, Scattering, Crystals, X-ray diffraction, Laser development, Solids, Laser crystals, Synchrotron radiation, Single crystal X-ray diffraction

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top