Dr. Thierry d'Almeida
at ESRF
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 October 2002
Proc. SPIE. 4780, Surface Scattering and Diffraction for Advanced Metrology II
KEYWORDS: Laser crystals, Crystals, Diffraction, X-ray diffraction, Laser development, Single crystal X-ray diffraction, Scattering, Metrology, Solids, Synchrotron radiation

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