Dr. Thomas James Belich
at Univ of Minnesota Twin Cities
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5843, Fluctuations and Noise in Materials II
KEYWORDS: Amorphous silicon, Nanoparticles, Electrodes, Particles, Dielectrics, Silicon, Transmission electron microscopy, Silicon films, Plasma enhanced chemical vapor deposition, Plasma

PROCEEDINGS ARTICLE | May 9, 2003
Proc. SPIE. 5112, Noise as a Tool for Studying Materials
KEYWORDS: Amorphous silicon, Electrodes, Particles, Silicon, Hydrogen, Doping, Silicon films, Statistical modeling, Temperature metrology, Plasma

PROCEEDINGS ARTICLE | July 13, 1998
Proc. SPIE. 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
KEYWORDS: Staring arrays, Software, Infrared imaging, Optical components, Sensors, Detector arrays, Projection systems, Infrared radiation, Optical alignment, Signal detection

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