Dr. Thomas Bibby
Staff Systems Engineer
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 18 March 2015 Paper
T. Cacouris, W. Conley, J. Thornes, T. Bibby, J. Melchior, T. Aggarwal, E. Gross
Proceedings Volume 9426, 942618 (2015) https://doi.org/10.1117/12.2085968
KEYWORDS: Light sources, Helium, Lithography, Optical lithography, Deep ultraviolet, Critical dimension metrology, Control systems, Manufacturing, Molybdenum, Semiconductors

Proceedings Article | 31 March 2014 Paper
R. Burdt, J. Thornes, T. Duffey, T. Bibby, R. Rokitski, E. Mason, J. Melchior, T. Aggarwal, D. Haran, J. Wang, G. Rechtsteiner, M. Haviland, D. Brown
Proceedings Volume 9052, 90522K (2014) https://doi.org/10.1117/12.2048082
KEYWORDS: Light sources, Semiconducting wafers, Lithography, Semiconductors, Scanners, Light, Optical amplifiers, Switching, Optical lithography, Near field optics

Proceedings Article | 1 May 1990 Paper
Michael Lurie, Gary Evans, Nils Carlson, David Bour, Robert Amantea, Jacob Hammer, Thomas Bibby, Dean Gilbert, So Liew
Proceedings Volume 1219, (1990) https://doi.org/10.1117/12.18260
KEYWORDS: Laser applications, Continuous wave operation, Semiconductor lasers, Temperature metrology, Visibility, Laser stabilization, Copper, Gallium arsenide, Quantum wells

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