Dr. Thomas Boettner
at dyadic computing gmbh
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Mathematical modeling, Mirrors, Light sources, Interferometers, Sensors, Fourier transforms, Interferometry, Chromium, Optical testing, Optical interferometry

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Mathematical modeling, Optical spheres, Cameras, Calibration, Numerical simulations, 3D modeling, 3D metrology, Projection systems, Virtual reality, 3D image processing

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