Dr. Thomas W. Buggey
X-ray Calibration Scientist at Open Univ
SPIE Involvement:
Publications (5)

SPIE Journal Paper | 14 October 2023 Open Access
JATIS, Vol. 9, Issue 04, 046001, (October 2023) https://doi.org/10.1117/12.10.1117/1.JATIS.9.4.046001
KEYWORDS: Dark current, CMOS sensors, Quantum efficiency, Image sensors, Electrooptics, X-ray astronomy, X-rays, Quantum reading, Photons, Manganese

Proceedings Article | 5 October 2023 Presentation + Paper
Proceedings Volume 12678, 126780I (2023) https://doi.org/10.1117/12.2674828
KEYWORDS: Dark current, Quantum efficiency, CMOS sensors, Image sensors, X-rays, Ionizing radiation, Electro optics, X-ray astronomy, Ion irradiation

Proceedings Article | 29 August 2022 Presentation + Paper
Proceedings Volume 12191, 121910N (2022) https://doi.org/10.1117/12.2630733
KEYWORDS: Sensors, X-rays, CMOS sensors, X-ray imaging, X-ray astronomy, Silicon, Photodiodes

Proceedings Article | 29 August 2022 Presentation + Paper
Proceedings Volume 12191, 121911J (2022) https://doi.org/10.1117/12.2629941
KEYWORDS: Charge-coupled devices, Performance modeling, Clocks, Data modeling, Electrons, X-rays, Space operations, Cryogenics, Instrument modeling, Sensors

SPIE Journal Paper | 26 May 2022
JATIS, Vol. 8, Issue 02, 028003, (May 2022) https://doi.org/10.1117/12.10.1117/1.JATIS.8.2.028003
KEYWORDS: Charge-coupled devices, Instrument modeling, Optimization (mathematics), X-rays, Electrodes, Space operations, Temperature metrology, Sensors, Data modeling, Performance modeling

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