Dr. Thomas Fries
CEO & Founder at FRT Fries Research & Technology GmbH
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 21 June 2015
Proc. SPIE. 9526, Modeling Aspects in Optical Metrology V
KEYWORDS: Thin films, Microscopes, Refractive index, Silica, Polarization, Silicon, Reflectivity, Fourier transforms, Collimators, Head

Proceedings Article | 20 October 2005
Proc. SPIE. 5965, Optical Fabrication, Testing, and Metrology II
KEYWORDS: Nanotechnology, Metrology, Optical sensors, Lenses, Sensors, Atomic force microscopy, Colorimetry, 3D metrology, Process control, Atomic force microscope

Proceedings Article | 20 October 2005
Proc. SPIE. 5965, Optical Fabrication, Testing, and Metrology II
KEYWORDS: Amorphous silicon, Microscopes, Calibration, Quartz, Ultraviolet radiation, Microscopy, Silicon, Optical microscopy, Reflectivity, Atomic force microscopy

Proceedings Article | 20 October 2005
Proc. SPIE. 5965, Optical Fabrication, Testing, and Metrology II
KEYWORDS: Metrology, Optical spheres, Sensors, Colorimetry, Computer generated holography, Optical metrology, Head, 3D metrology, Aspheric lenses, Spherical lenses

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