Dr. Thomas A. Germer
Physicist/Researcher at National Institute of Standards and Technology
SPIE Involvement:
Conference Program Committee | Author | Instructor | Special Event Speaker
Area of Expertise:
Scattering , Diffraction , Polarization , Ellipsometry , Optical Properties
Publications (61)

Proceedings Article | 21 November 2023 Presentation + Paper
C. Tarrio, S. Grantham, R. Vest, T. Germer, B. Barnes, S. Moffitt, B. Simonds, M. Spidell
Proceedings Volume 12750, 127500F (2023) https://doi.org/10.1117/12.2686832
KEYWORDS: Extreme ultraviolet, Tunable filters, Metrology, Extreme ultraviolet lithography, Radiometry, Scatterometry, Vacuum chambers, Reflectivity, Polarization, Equipment

Proceedings Article | 15 March 2023 Presentation
Proceedings Volume PC12382, PC123820F (2023) https://doi.org/10.1117/12.2655702
KEYWORDS: Tissue optics, Spatial frequencies, Optical alignment, Mueller matrices, Biomedical optics

SPIE Journal Paper | 14 December 2022 Open Access
JBO, Vol. 27, Issue 12, 126003, (December 2022) https://doi.org/10.1117/12.10.1117/1.JBO.27.12.126003
KEYWORDS: Mueller matrices, Spatial frequencies, Bidirectional reflectance transmission function, Scattering, White matter, Polydimethylsiloxane, Biomedical optics, Polarization, Thalamus, Polarimetry

Proceedings Article | 3 October 2022 Presentation + Paper
Ulf Griesmann, Keiko Munechika, T. Brian Renegar, X. Alan Zheng, Johannes Soons, Thomas Germer, Weilun Chao, Ian Lacey, Carlos Pina-Hernandez, Peter Takacs, Valeriy Yashchuk
Proceedings Volume 12223, 1222306 (2022) https://doi.org/10.1117/12.2633411
KEYWORDS: Microscopes, Spatial frequencies, Standards development, Confocal microscopy, Interferometry, Optical microscopes

Proceedings Article | 7 March 2022 Presentation
Proceedings Volume PC11963, PC1196304 (2022) https://doi.org/10.1117/12.2615353
KEYWORDS: Tissues, Polarimetry, Scattering, Multilayers, Light sources, Collagen, Cancer, Anisotropy

Showing 5 of 61 publications
Conference Committee Involvement (8)
Polarized Light and Optical Angular Momentum for Biomedical Diagnostics 2025
25 January 2025 | San Francisco, California, United States
Polarized Light and Optical Angular Momentum for Biomedical Diagnostics 2024
27 January 2024 | San Francisco, California, United States
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V
24 August 2011 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
28 August 2007 | San Diego, California, United States
Optical Fabrication, Testing, and Metrology II
13 September 2005 | Jena, Germany
Showing 5 of 8 Conference Committees
Course Instructor
SC492: Predicting, Modeling, and Interpreting Light Scattered by Surfaces
The measurement of light scattered by surfaces can be used to locate and identify roughness, particulates, and defects on a wide variety of materials. Applications include the inspection of silicon wafers, optics, and storage media, characterization of thin film roughness, identification of objects in remote sensing, and prediction of optical system performance. The aim of this course is to provide tools to engineers and scientists to enable them to predict scattering for different sources, differentiate amongst different scattering sources, and to design instrumentation that maximizes sensitivity or differentiation amongst scattering sources for their specific application. Emphasis will be placed on the use of the SCATMECH library of scattering codes and the Modeled Integrated Scatter Tool (MIST) in order to minimize the mathematics that can often be a barrier to those who would otherwise be interested in using optical scatter. The measurement of scatter is emphasized in SC1003 taught by John Stover.
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