Mr. Thomas G. Graf
at Kings College London
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 13, 2004
Proc. SPIE. 5193, Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications
KEYWORDS: Mirrors, Multilayers, Reflection, X-rays, Interfaces, Reflectivity, Polarizers, Extreme ultraviolet, Aluminum, Monochromators

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