Dr. Thomas Krist
at Hahn-Meitner-Institut
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 2 October 2019
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Diffraction, Diffraction, Mirrors, Optical design, Optical design, Error analysis, Error analysis, X-rays, X-rays, Spectrometers, Ray tracing, Ray tracing, Spectral resolution, Spherical lenses, Diffraction gratings

Proceedings Article | 8 November 2001
Proc. SPIE. 4509, Neutron Optics
KEYWORDS: Optical components, Polarization, Sensors, Silicon, Magnetism, Polarizers, Collimators, Gadolinium, Solid state physics, Semiconducting wafers

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