In order to meet the goals of the Department of Defense (DoD) for smaller and more accurate weapons, numerous
projects are currently investigating the miniaturization of weapons and munition fuze components. One of these
efforts is to characterize the performance of small detonators. The velocity of the flyer, the key component
needed to initiate a detonation sequence, can be measured using a photonic Doppler velocimeter (PDV). The
purpose of this research was to develop a microelectromechanical system (MEMS) device that would act as an
optimal retroreflective surface for the PDV. Two MEMS solutions were explored: one using the PolyMUMPs<sup>TM</sup>
fabrication process and one in-house fabrication design using silicon on insulator (SOI) wafers. The in-house
design consisted of an array of corner reflectors created using an SOI wafer. Each corner reflector consisted of
three separate mirror plates which were self-assembled by photoresist pad hinges. When heated to a critical
temperature (typically 140-160 °C), the photoresist pads melted and the resulting surface tension caused each
mirror to rotate into place. The resulting array of corner reflectors was then coated with a thin layer of gold to
increase reflectivity. Despite the successful assembly of a PolyMUMPs<sup>TM</sup> corner reflector, assembling an array of
these reflectors was found to be unfeasible. Although the SOI corner reflector design was completed, these devices
were not fabricated in time for testing during this research. However, the bidirectional reflectance distribution
function (BRDF) and optical cross section (OCS) of commercially available retroreflective tapes were measured.
These results can be used as a baseline comparison for future testing of a fabricated SOI corner reflector array.