Dr. Thomas T. Lu
Senior Researcher at Jet Propulsion Lab
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (67)

PROCEEDINGS ARTICLE | May 9, 2018
Proc. SPIE. 10652, Disruptive Technologies in Information Sciences
KEYWORDS: Visual process modeling, Detection and tracking algorithms, Data modeling, Modulation, Machine vision, Neural networks, Speech recognition, Data centers, Data communications, Speaker recognition

PROCEEDINGS ARTICLE | April 30, 2018
Proc. SPIE. 10649, Pattern Recognition and Tracking XXIX
KEYWORDS: Mathematical modeling, Transparency, Injuries, Visualization, Glasses, Physics, Augmented reality, Network architectures, Information visualization, Brain

PROCEEDINGS ARTICLE | April 30, 2018
Proc. SPIE. 10649, Pattern Recognition and Tracking XXIX
KEYWORDS: Infrared imaging, Video acceleration, Data modeling, Image segmentation, Image processing, Video, Image registration, Augmented reality, Neural networks, Autoregressive models

PROCEEDINGS ARTICLE | April 27, 2018
Proc. SPIE. 10649, Pattern Recognition and Tracking XXIX
KEYWORDS: Infrared imaging, Data modeling, Image segmentation, Image processing, Computer programming, Neural networks, Infrared radiation, Image enhancement, Image classification, Neurons

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10203, Pattern Recognition and Tracking XXVIII
KEYWORDS: Image processing algorithms and systems, Thermography, Infrared imaging, Short wave infrared radiation, Detection and tracking algorithms, Image segmentation, Video, Wavelets, Reflectivity, Computing systems, Computer vision technology, Machine vision, Image filtering, Neural networks, Shortwaves, Image understanding, Medium wave

PROCEEDINGS ARTICLE | April 20, 2016
Proc. SPIE. 9845, Optical Pattern Recognition XXVII
KEYWORDS: Actuators, Tunable lasers, Waveguides, Cladding, Spectroscopy, Semiconductor lasers, Liquid crystals, Laser spectroscopy, Electro optics, Absorption

Showing 5 of 67 publications
Conference Committee Involvement (4)
Pattern Recognition and Tracking XXX
14 April 2019 | Baltimore, Maryland, United States
Pattern Recognition and Tracking XXIX
18 April 2018 | Orlando, Florida, United States
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V
27 January 1998 | San Jose, CA, United States
Multidimensional Spectroscopy: Acquisition, Interpretation, and Automation
27 January 1998 | San Jose, CA, United States
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