Thomas Nisius
at RheinAhrCampus Remagen
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Vanadium, Optical filters, X-ray optics, X-rays, Light scattering, Nitrogen, Bioalcohols, Laser induced plasma spectroscopy, Aluminum, Plasma

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Microscopes, Optical filters, Polymethylmethacrylate, Nickel, Silicon, Aluminum, Zone plates, Zirconium, Free electron lasers, Absorption

Proceedings Article | 29 August 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Microscopes, Titanium, X-rays, X-ray microscopy, Nitrogen, Imaging spectroscopy, Laser induced plasma spectroscopy, Extreme ultraviolet, Zone plates, Plasma

Proceedings Article | 29 August 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Visible radiation, Imaging systems, Cameras, Sensors, Crystals, X-rays, Scintillators, Wavefront sensors, Wavefronts, Extreme ultraviolet

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