Prof. Thomas Ortlepp
at CiS Research Institute for Microsensor Systems
SPIE Involvement:
Publications (14)

Proceedings Article | 10 March 2020
Proc. SPIE. 11293, MOEMS and Miniaturized Systems XIX
KEYWORDS: Beam splitters, Phase shifting, Avalanche photodetectors, Scattering, Silicon, Single photon, Laser scattering, Optical simulations, Avalanche photodiodes, Quantum cryptography

Proceedings Article | 2 March 2020
Proc. SPIE. 11279, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIII
KEYWORDS: Microelectromechanical systems, Packaging, Gas sensors, Modulation, Silicon, Gases, Resistance, Platinum, Infrared spectroscopy, Black bodies, Infrared radiation, Photometry, Infrared technology, Infrared detection, Temperature metrology

Proceedings Article | 28 February 2020
Proc. SPIE. 11293, MOEMS and Miniaturized Systems XIX
KEYWORDS: Thin films, Optical properties, Photonic crystals, Infrared radiation, Molybdenum, Absorption

Proceedings Article | 28 February 2020
Proc. SPIE. 11286, Optical Interconnects XX
KEYWORDS: Optical fibers, Fiber Bragg gratings, Sensors, Silicon, Superconductors, Photodiodes, Fiber optics sensors, Fiber couplers, Single photon detectors, Semiconducting wafers

Proceedings Article | 1 March 2019
Proc. SPIE. 10940, Light-Emitting Devices, Materials, and Applications
KEYWORDS: Gold, Thermography, Light emitting diodes, Polymers, Ultraviolet radiation, Silver, Reliability, Resistance, Scanning electron microscopy, Ultraviolet light emitting diodes

Showing 5 of 14 publications
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