Dr. Thomas Rinder
at Univ der Bundeswehr Hamburg
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 4 November 2003
Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
KEYWORDS: Signal to noise ratio, Mirrors, Polarization, Sensors, Particles, Light scattering, Detector arrays, Solids, Semiconducting wafers, Scatter measurement

Proceedings Article | 16 October 2003
Proc. SPIE. 5189, Surface Scattering and Diffraction III
KEYWORDS: Gold, Diffraction, Scattering, Dielectrics, Light scattering, Atomic force microscopy, Inverse problems, Bidirectional reflectance transmission function, Scatter measurement, Diffraction gratings

Proceedings Article | 16 October 2003
Proc. SPIE. 5189, Surface Scattering and Diffraction III
KEYWORDS: Gold, Modeling, Scattering, Matrices, Particles, Dielectrics, Computing systems, Atomic force microscopy, Software development, Parallel computing

Proceedings Article | 16 October 2003
Proc. SPIE. 5189, Surface Scattering and Diffraction III
KEYWORDS: Mirrors, CMOS sensors, Optical sensors, Sensors, Light scattering, Detector arrays, Bidirectional reflectance transmission function, Solids, Scatter measurement, Autoregressive models

Proceedings Article | 11 November 2002
Proc. SPIE. 4779, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components
KEYWORDS: Signal to noise ratio, Mirrors, CMOS sensors, Sensors, Particles, Silicon, Light scattering, Solids, Scatter measurement, Autoregressive models

Showing 5 of 14 publications
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