Dr. Thomas J. Rotter
Director of R&D at Team Technologies Inc
SPIE Involvement:
Publications (18)

Proceedings Article | 13 March 2024 Presentation
Proceedings Volume 12867, 1286710 (2024) https://doi.org/10.1117/12.3002447
KEYWORDS: Electrodes, Semiconductor lasers, Photonic crystals, Three dimensional sensing, Semiconductors, Optical simulations, Materials properties, Materials processing, Light sources, Laser applications

Proceedings Article | 13 March 2024 Presentation
Proceedings Volume PC12891, PC128910A (2024) https://doi.org/10.1117/12.3002723
KEYWORDS: Silicon, Gallium antimonide, Tunable filters, Optoelectronics, Transmission electron microscopy, Mid-IR, Laser development, X-ray diffraction, Spectroscopy, Semiconductor lasers

Proceedings Article | 9 March 2024 Presentation
Proceedings Volume PC12882, PC1288208 (2024) https://doi.org/10.1117/12.3003063
KEYWORDS: Quantum dots, Gallium antimonide, Silicon, Molecular beam epitaxy, Gallium arsenide, Transmission electron microscopy, Spectroscopy, Photoluminescence, Lithography, HF etching

Proceedings Article | 9 June 2023 Presentation
Marek Osinski, Sami Nazib, Troy Hutchins-Delgado, Erika Sommer, Hosuk Lee, Loic Djamen Tchapda, Ruth Gyan-Darkwa, Erum Jamil, Thomas Rotter, Ganesh Balakrishnan, John Nogan, Tzu-Ming Lu, Ivan Komissarov, Roman Sobolewski
Proceedings Volume PC12570, PC1257003 (2023) https://doi.org/10.1117/12.2670470
KEYWORDS: Waveguides, Single photon detectors, Silicon, Quantum photonics, Integrated circuits, Fabrication, Design and modelling, Quantum entanglement, Quantum coherence, Active optics

Proceedings Article | 5 March 2022 Presentation
Chadwick Canedy, William Bewley, Stephanie Tomasulo, Chul Soo Kim, Charles Merritt, Igor Vurgaftman, Jerry Meyer, Mijin Kim, Thomas Rotter, Ganesh Balakrishnan, Terry Golding
Proceedings Volume PC12006, PC120060B (2022) https://doi.org/10.1117/12.2607369
KEYWORDS: Silicon, Semiconducting wafers, Gallium antimonide, Light emitting diodes, Continuous wave operation, Mid-IR, Manufacturing, Control systems, Surface roughness, Photonic integrated circuits

Showing 5 of 18 publications
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