Dr. Thomas Tschentscher
Scientific Director, Mbr. of the Management Board at European XFEL GmbH
SPIE Involvement:
Conference Chair | Editor | Author
Publications (18)

SPIE Conference Volume | 11 July 2017

Proceedings Article | 29 June 2017
Proc. SPIE. 10241, Research Using Extreme Light: Entering New Frontiers with Petawatt-Class Lasers III
KEYWORDS: Optoelectronics, Current controlled current source

Proceedings Article | 21 June 2017
Proc. SPIE. 10236, Damage to VUV, EUV, and X-ray Optics VI
KEYWORDS: Photons, Electrons, Materials processing, Physics, Raman spectroscopy, Analytical research, Free electron lasers, States of matter, Stanford Linear Collider, Lead

Proceedings Article | 16 June 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: X-ray optics, Femtosecond phenomena, High power lasers, X-rays, X-ray sources, Physics, X-ray lasers, Laser optics, Free electron lasers, Current controlled current source

Proceedings Article | 8 October 2014
Proc. SPIE. 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
KEYWORDS: Temporal coherence, Mirrors, Multilayers, Beam splitters, X-rays, Coating, Reflectivity, Wavefronts, Adaptive optics, Picosecond phenomena

SPIE Conference Volume | 20 May 2013

Showing 5 of 18 publications
Conference Committee Involvement (4)
X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation
4 April 2019 | Prague, Czech Republic
X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation
26 April 2017 | Prague, Czech Republic
Advances in X-ray Free-Electron Lasers II: Instrumentation
17 April 2013 | Prague, Czech Republic
Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics and Instrumentation
20 April 2011 | Prague, Czech Republic
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