Dr. Thomas M. Wood
Postdoc at
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | September 10, 2013
OE Vol. 52 Issue 09
KEYWORDS: Refractive index, Dispersion, Polymers, Ceramics, Thin films, Ellipsometry, Iron, Polymer thin films, Temperature metrology, Polarization

PROCEEDINGS ARTICLE | October 25, 2012
Proc. SPIE. 8466, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI
KEYWORDS: Thin films, Ellipsometry, Refractive index, Prisms, Iron, Dispersion, Polymers, Ceramics, Polymer thin films, Temperature metrology

PROCEEDINGS ARTICLE | October 11, 2012
Proc. SPIE. 8486, Current Developments in Lens Design and Optical Engineering XIII
KEYWORDS: Thin films, Refractive index, Prisms, Glasses, Ultraviolet radiation, Interfaces, Coating, Nondestructive evaluation, Photoresist materials, Radio propagation

PROCEEDINGS ARTICLE | October 1, 2011
Proc. SPIE. 8172, Optical Complex Systems: OCS11
KEYWORDS: Thin films, Refractive index, Prisms, Dispersion, Polymers, Interfaces, Silicon, Silicon films, Photorefractive polymers, Temperature metrology

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