Thomas Zeuner
at Leibniz-Institut für Photonische Technologien eV
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Mirrors, Avalanche photodetectors, Scattering, Sensors, Spectroscopy, Laser induced damage, Laser scattering, Reflectivity, Optical testing, Absorption

Proceedings Article | 16 February 2011
Proc. SPIE. 7912, Solid State Lasers XX: Technology and Devices
KEYWORDS: Optical filters, Optical amplifiers, Oscillators, Switching, Quartz, Amplifiers, Transmittance, Optical filtering, Disk lasers, Laser systems engineering

Proceedings Article | 29 November 2010
Proc. SPIE. 7842, Laser-Induced Damage in Optical Materials: 2010
KEYWORDS: Near infrared, Femtosecond phenomena, Ultraviolet radiation, Luminescence, Optical simulations, Picosecond phenomena, Sodium, Pulsed laser operation, Fine needle aspiration, Absorption

Proceedings Article | 31 December 2009
Proc. SPIE. 7504, Laser-Induced Damage in Optical Materials: 2009
KEYWORDS: Femtosecond phenomena, Deep ultraviolet, Annealing, Luminescence, Excitons, Sodium, Pulsed laser operation, Solar thermal energy, Fine needle aspiration, Absorption

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