Dr. Thorsten Dziomba
at Physikalisch-Technische Bundesanstalt
SPIE Involvement:
Publications (4)

Proceedings Article | 22 July 2019 Paper
Proceedings Volume 11076, 110761S (2019) https://doi.org/10.1117/12.2527202
KEYWORDS: Optical filters, Light sources, Image sensors, Sensors, Light emitting diodes, Oxygen, Oximetry, Tissue optics, Signal detection, Signal processing

Proceedings Article | 20 October 2005 Paper
Thorsten Dziomba, Ludger Koenders, Günter Wilkening
Proceedings Volume 5965, 59650C (2005) https://doi.org/10.1117/12.626018
KEYWORDS: Scanning probe microscopy, Calibration, Standards development, Metrology, Atomic force microscopy, Scanners, Scanning electron microscopy, Electronics, Nanotechnology, Control systems

Proceedings Article | 24 May 2004 Paper
Wolfgang Haessler-Grohne, Thorsten Dziomba, Carl Frase, Harald Bosse, Jerry Prochazka
Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.536285
KEYWORDS: Scanning electron microscopy, Atomic force microscopy, Calibration, Line edge roughness, Metrology, Interferometers, Microscopes, Phase shifts, Very large scale integration, Electron microscopes

Proceedings Article | 30 April 1998 Paper
U. Fischer, A. Naber, T. Dziomba, J. Koglin, W. Goehde, O. Panzer, Harald Fuchs
Proceedings Volume 3272, (1998) https://doi.org/10.1117/12.307133
KEYWORDS: Near field, Near field scanning optical microscopy, Molecules, Near field optics, Microscopy, Energy transfer, Metals, Lithography, Photomasks, Diffraction

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