Dr. Thorsten Pfister
Head/Process Metrology Group at TU Dresden
SPIE Involvement:
Author
Publications (13)

SPIE Journal Paper | 31 January 2012
OE Vol. 51 Issue 1
KEYWORDS: Sensors, Fiber optics sensors, Head, Interferometry, Fiber optics, 3D metrology, Metals, Calibration, Scattering, Light scattering

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Doppler effect, Sensors, Metals, Interferometry, Fiber optics sensors, Temporal resolution, Head, Distance measurement, 3D metrology, Velocity measurements

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Doppler effect, Sensors, Calibration, Composites, Inspection, Interferometry, Optical testing, Distance measurement, Motion measurement, Protactinium

Proceedings Article | 14 September 2010
Proc. SPIE. 7387, Speckle 2010: Optical Metrology
KEYWORDS: Doppler effect, Sensors, Calibration, Light scattering, Solid state lasers, Vibrometry, Phase measurement, Radium, Signal detection, Solid state electronics

Proceedings Article | 14 May 2010
Proc. SPIE. 7718, Optical Micro- and Nanometrology III
KEYWORDS: Doppler effect, Sensors, Calibration, Composites, Interferometry, Fiber optics sensors, Optical testing, Temporal resolution, Distance measurement, Motion measurement

Showing 5 of 13 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top