Thorsten Zweipfenning
at RWTH Aachen Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 March 2023 Presentation
Proceedings Volume PC12421, (2023) https://doi.org/10.1117/12.2646670
KEYWORDS: Gallium nitride, Temperature metrology, Luminescence, Diffusion, Visualization, Spatial resolution, Scanning electron microscopy, Line scan image sensors, Excitons, Electron microscopes

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