Dr. Tiago L. F. C. Pinto
Associate Professor at Univ Federal de Santa Catarina
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: 3D acquisition, Optical spheres, Imaging systems, Cameras, Calibration, Clouds, Optical testing, Projection systems, Stereo vision systems, 3D image processing

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