Dr. Tian Chen
at Shanghai Dianji Univ
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | September 10, 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Statistical analysis, Detection and tracking algorithms, Denoising, Inspection, Clouds, Feature extraction, Data acquisition, Data processing, 3D metrology, Lead

PROCEEDINGS ARTICLE | September 10, 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Optical sensors, Sensors, Calibration, Manufacturing, Inspection, Control systems, Clouds, 3D metrology, Optical alignment, Optical calibration

PROCEEDINGS ARTICLE | July 14, 2003
Proc. SPIE. 4890, Ecosystems Dynamics, Ecosystem-Society Interactions, and Remote Sensing Applications for Semi-Arid and Arid Land
KEYWORDS: Agriculture, Soil science, Fluctuations and noise, Remote sensing, Vegetation, Ecology, Ecosystems, Information technology, Climatology, Geography

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