Mr. Tian Guangjun
at Yanshan Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 13, 2006
Proc. SPIE. 6280, Third International Symposium on Precision Mechanical Measurements
KEYWORDS: MATLAB, Contamination, Statistical analysis, Sensors, Luminescence, Error analysis, Lamps, Computing systems, 3D metrology, Monochromators

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