Dr. Tieling Chen Profile

Dr. Tieling Chen

at Univ of South Carolina

SPIE Involvement:

Editor | Author

Publications (5)

Proceedings Article | 29 August 2016 Paper

Tone correction through a spherical color model

Tieling Chen, Jun Ma

Proceedings Volume 10033, 100334Y (2016) https://doi.org/10.1117/12.2244681

KEYWORDS: RGB color model, Spherical lenses, Mathematical modeling, Image segmentation, Visualization, Visual process modeling, Image processing, Mathematics, Computer science, Color image processing

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SPIE Journal Paper | 18 December 2013

Attributes of color represented by a spherical model

Tieling Chen, Jun Ma, Zhongmin Deng

JEI, Vol. 22, Issue 04, 043032, (December 2013) https://doi.org/10.1117/12.10.1117/1.JEI.22.4.043032

KEYWORDS: RGB color model, Spherical lenses, Mathematical modeling, Visual process modeling, Systems modeling, Human vision and color perception, Mathematics, Roads, Computing systems, Computer science

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Proceedings Article | 4 February 2013 Paper

A spherical perceptual color model

Tieling Chen, Zhongmin Deng, Jun Ma

Proceedings Volume 8652, 865202 (2013) https://doi.org/10.1117/12.2004211

KEYWORDS: RGB color model, Mathematical modeling, Spherical lenses, Visual process modeling, 3D modeling, Distance measurement, Systems modeling, Human vision and color perception, Mathematics, Computer science

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Proceedings Article | 3 March 2008 Paper

Derivative operator on smoothed images

Tieling Chen

Proceedings Volume 6812, 68120M (2008) https://doi.org/10.1117/12.769679

KEYWORDS: Smoothing, Edge detection, Image processing, Convolution, Gaussian filters, Image filtering, Wavelets, Signal detection, Buildings, Electronic filtering

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Proceedings Article | 17 February 2006 Paper

A modified wavelet-transformation-based-method of linear object extraction

Tieling Chen

Proceedings Volume 6064, 60640P (2006) https://doi.org/10.1117/12.643612

KEYWORDS: Wavelets, Image processing, Smoothing, Edge detection, Roads, Image segmentation, Remote sensing, Feature extraction, Image resolution, Convolution

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Proceedings Volume Editor (1)

SPIE Conference Volume | 12 August 2021

Sixth International Workshop on Pattern Recognition

Conference Committee Involvement (1)

Sixth International Workshop on Pattern Recognition

25 June 2021 | Chengdu, China

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