Dr. Timothy Tsuei
Program Manager at Synopsys Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 March 2020 Presentation + Paper
Proc. SPIE. 11328, Design-Process-Technology Co-optimization for Manufacturability XIV
KEYWORDS: Lithography, Optical lithography, Visualization, Silicon, Design for manufacturing, Semiconducting wafers, Process modeling, Device simulation

Proceedings Article | 6 December 2004 Paper
Proc. SPIE. 5567, 24th Annual BACUS Symposium on Photomask Technology
KEYWORDS: Lithography, Optical lithography, Data modeling, Error analysis, Bridges, Photomasks, Optical proximity correction, Critical dimension metrology, Process modeling, Resolution enhancement technologies

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