Tito Dutta Chowdhury
Principal Engineer
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 29 April 2004 Paper
Tito Chowdhury, Mark Freeland, Ole Krogh, Geethakrishnan Narasimhan, Gayathri Raghavendra
Proceedings Volume 5378, (2004) https://doi.org/10.1117/12.536454
KEYWORDS: Etching, Instrument modeling, Performance modeling, Semiconducting wafers, Process modeling, Process control, Calibration, Data modeling, Semiconductors, Photomasks

Proceedings Article | 12 June 2003 Paper
Tito Chowdhury, Hanna Bamnolker, Roni Khen, Chan-Lon Yang, Hean-Cheal Lee, Yan Du, Meihua Shen, Jinhan Choi, Shashank Deshmukh
Proceedings Volume 5039, (2003) https://doi.org/10.1117/12.485151
KEYWORDS: Line edge roughness, Etching, Chemistry, Polymers, Plasma etching, Plasma, Critical dimension metrology, Photomasks, Photoresist processing, Semiconducting wafers

Proceedings Article | 2 June 2003 Paper
Ole Krogh, Mark Freeland, Ron Mori, Tito Chowdhury
Proceedings Volume 5038, (2003) https://doi.org/10.1117/12.483671
KEYWORDS: Etching, Semiconducting wafers, Process control, Photomasks, Process modeling, Chromium, Semiconductors, Metals, Critical dimension metrology, Lithography

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