Tobias Binkele
Student at Hochschule Bremen Univ of Applied Sciences
SPIE Involvement:
Publications (7)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Optical components, Data modeling, Reflection, Cameras, Sensors, Matrices, Ray tracing, Systems modeling, Process modeling

Proceedings Article | 4 March 2019
Proc. SPIE. 10925, Photonic Instrumentation Engineering VI
KEYWORDS: Gradient-index optics, GRIN lenses, Diffraction, Refractive index, Interferometry, Wavefronts, Printing, Ray tracing, Optics manufacturing, Phase shifts

Proceedings Article | 28 May 2018
Proc. SPIE. 10695, Optical Instrument Science, Technology, and Applications
KEYWORDS: Metrology, Optical spheres, Data modeling, Reflection, Calibration, Numerical integration, Optical testing, Optical metrology, Industrial metrology, Ray tracing, Freeform optics, Spherical lenses

Proceedings Article | 16 October 2017
Proc. SPIE. 10448, Optifab 2017
KEYWORDS: Optical components, Metrology, Optical spheres, Lenses, Sensors, Reflectivity, Optical testing, Ray tracing, Reconstruction algorithms

Proceedings Article | 26 June 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Reflection, Imaging systems, Cameras, Sensors, Calibration, Reflectivity, Deflectometry, Head, Zernike polynomials, Ray tracing, Precision measurement, Optical calibration, Signal detection

Showing 5 of 7 publications
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