Mr. Tobias Boettcher
at Institut für Technische Optik, Uni Stutttgart
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Confocal microscopy, Microscopes, Refractive index, Optical spheres, Interferometers, Inspection, Interferometry, Optical testing, Tomography, Refraction, Objectives

PROCEEDINGS ARTICLE | September 1, 2015
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Optical imaging, Mirrors, Beam splitters, Light sources, Imaging systems, Cameras, Sensors, Optical coherence tomography, Signal processing, Objectives

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9529, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials II
KEYWORDS: Signal to noise ratio, Mirrors, Light sources, Phase shifting, Interferometers, Cameras, Optical coherence tomography, Skin cancer, Molybdenum, Phase shifts

PROCEEDINGS ARTICLE | May 1, 2014
Proc. SPIE. 9132, Optical Micro- and Nanometrology V
KEYWORDS: Optical design, Beam splitters, Imaging systems, Interferometers, Cameras, Sensors, Optical coherence tomography, Skin, Tissue optics, Electroluminescent displays

PROCEEDINGS ARTICLE | May 1, 2014
Proc. SPIE. 9132, Optical Micro- and Nanometrology V
KEYWORDS: Confocal microscopy, Light sources, Interferometers, Sensors, Spectroscopy, Interferometry, Colorimetry, Laser speckle contrast imaging, Phase measurement, Diffraction gratings

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Confocal microscopy, Microscopes, Diffractive optical elements, Interferometers, Sensors, Calibration, Wavelets, Interferometry, Colorimetry, Objectives

Showing 5 of 6 publications
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